Researchers have developed a new calibration method for the optical system of infrared CMOS-theodolites, instruments used in high-precision astronomical measurements. This advance is crucial for improving the accuracy of observations in fields such as astrometry and geodynamics, where angular precision is fundamental. Precise calibration of these systems is a challenge due to inherent distortions in optical and electronic components, especially in the infrared range.

The proposed method focuses on correcting aberrations and distortions introduced by the lens and the CMOS sensor, which can significantly affect the determination of the angular position of celestial objects. Traditionally, the calibration of optical instruments for astronomy has required complex and often costly procedures, which are not always suitable for systems operating in the infrared or using CMOS sensors, which have different response characteristics than CCDs.

The importance of this work lies in enabling more reliable astronomical data to be obtained with infrared instrumentation, paving the way for better characterization of phenomena such as Earth's polar motion, Earth's rotation, and the determination of geodetic coordinates. The improvement in angular measurement precision with infrared theodolites has direct implications for space navigation, high-precision geodesy, and monitoring the stability of large-scale infrastructures.